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Extends Highly Parallel Testing Capabilities. 0000252684 00000 n
Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 0000033307 00000 n
DC testing Shmoo tools, data logging, and histograms. TSE: 6857. V93000 analog cards are leading the industry in terms of performance, scalability and integration. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. 0000332614 00000 n
All Rights Reserved. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Key concepts and components of the V93000. PDF User Guide. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. 0000010551 00000 n
Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Advantest Corporation
Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. TSE: 6857. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. 0000176239 00000 n
Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. 0000033389 00000 n
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The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. Agenda www.chiptest.in 3. If there is a survey it only takes 5 minutes, try any survey which works for you. Theme by spirit halloween lol costume. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. Superior x/y repeatability after cleaning step. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. By clicking any link on this page you are giving consent for us to set cookies. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. TSE: 6857. Auto Loading / Unloading Feature for Manual Equipment . 0000058694 00000 n
Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Reducing loadboard complexity in Power Applications. 0000160939 00000 n
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E-mail Kantor :
[email protected] TSE: 6857. 0000013109 00000 n
Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. Automation Solutions A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: ProgramGenerator. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Calibration, test flow, test methods, debbuging tools, and concepts. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. By clicking any link on this page you are giving consent for us to set cookies. 0000001756 00000 n
SOC ATE . Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. TEAM A.T.E. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. 11 0 obj
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The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Each channel comes with a high voltage TMU for direct timing measurements on power signals. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. 0000168589 00000 n
; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . %PDF-1.4
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The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. 0000321810 00000 n
V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. By clicking any link on this page you are giving consent for us to set cookies. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. Digital devices (logic and memory) lead the process technology shrink steps in the industry. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. This paragraph applies only to the extent permitted by applicable law. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. 0000012183 00000 n
Smart Test, Smart ATE, Smart Scale. 0000237580 00000 n
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Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. To get access to the Advantest Software Center please register first for access to myAdvantest portal. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. 0000014447 00000 n
A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. 0000007336 00000 n
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Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Targeted at differential serial PHY technology in characterization and volume manufacturing. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. 0000031694 00000 n
Advantest Corporation
The V93000 is widely accepted at the leading IDMs, foundries and design houses. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. View and Download Advantest instruction manual online. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. Click on more information for further details. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Powered by . 0000080030 00000 n
The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. (Cut outs impact deflection/rigidity properties). Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. 0000079792 00000 n
Click on more information for further details. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. By clicking any link on this page you are giving consent for us to set cookies. Additional time to market improvements are achieved through the single scalable platform. User-specific tests are programmed with test methods in C. Links are . The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Technical Documentation The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. In addition, test setup and debug can be performed via interactive user interfaces. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. T2000. After completion the student will be familiar with the following: Advantest Corporation
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Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. 0000003026 00000 n
All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. 0000016567 00000 n
Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. 0000031852 00000 n
With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. Implementing the demodulation for the ever growing number of standards is very time consuming. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. 0000059227 00000 n
Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. .4(m $8@
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B|rKu6\"]]n With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. The platform has become the all purpose reference platform. Maximum Investment Protection and Flexibility, Advantest Corporation
For Simulation to ATEand. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. More information is available at www.advantest.com FEb2 Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) Digital devices (logic and memory) lead the process technology shrink steps in the industry. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. Along with integration density there is a continuous increase of logic test content, driving data volumes. trailer
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computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. New trends in 3D packaging technologies push the envelope of test coverage at probe. Verigy V93000 Pin Scale 1600 VelocityCAE. 0000349795 00000 n
83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . Engineering time is reduced through test program reuse. 0000031783 00000 n
yc+5I|w&-/-6d0E^ [6cf,/* Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel.
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